"ONYX graphene and 2D materials inspector."

Who: Albert Redo-Sanchez, Terahertz Technology Manager, das-Nano

Place: nanoGUNE seminar room, Tolosa Hiribidea 76, Donostia - San Sebastian

Date: Monday, 4 September 2017, 11:00

Onyx is a turnkey, non-contact and non-destructive device for the inspection of several properties of graphene and other 2D materials. Onyx generates full-area maps of conductance, resistance, and other parameters from materials such as graphene, GaN, PEDOT, ITO, NbC, ALD, spin coated photo-resins. The maps provide information about the homogeneity and quality. Similar characterization is currently realized by nano-scale methods, such as confocal Raman spectroscopy, Atomic Force Microscopy, or Transmission Electron Microscopy, and/or macro-scale methods, such as van der Pauw or optical microscopy. However, nano-scale methods are slow and cannot characterize large surfaces. Macro-scale methods generate characterization that average the magnitudes and, thus, cannot provide localized information. Onyx provides meso-scale characterization and covers the gap between nano-scale and macro-scale methods. Onyx is a terahertz-based system that works in reflection geometry as opposed to state-of-the-art methods and provides conductance and resistance maps in the terahertz range. Onyx can be integrated with reactors and enable monitoring production in real-time. Therefore, Onyx could support the production of graphene at industrial scale. Onyx can implement characterization standardized protocols for accurate and repeatable measurements

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